Exploring the detection limits of infrared near-field microscopy regarding small buried structures and pushing them by exploiting superlens-related effects

标题
Exploring the detection limits of infrared near-field microscopy regarding small buried structures and pushing them by exploiting superlens-related effects
作者
关键词
-
出版物
OPTICS EXPRESS
Volume 24, Issue 5, Pages 4431
出版商
The Optical Society
发表日期
2016-02-24
DOI
10.1364/oe.24.004431

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