期刊
MICROSCOPY
卷 -, 期 -, 页码 -出版社
OXFORD UNIV PRESS
DOI: 10.1093/jmicro/dfad045
关键词
in-situ observation; transmission electron microscopy; shear observation; simple shear; nanoscale deformation; soft materials
类别
We developed an in-situ shear test system for TEM to investigate the nanoscale shear deformation behaviors in nanoparticle-filled rubber. The results showed that the shear deformation process exhibited almost perfect simple shear, and voids grew along the maximum principal strain at the nanoscale. The nanoscale regions with rubber and silica aggregates exhibited deformation behaviors similar to the global shear deformation.
We developed an in-situ shear test system suitable for transmission electron microscopy (TEM) observations, which enabled us to examine the shear deformation behaviours inside soft materials at nanoscale resolutions. This study was conducted on a nanoparticle-filled rubber to investigate its nanoscale deformation behaviour under a large shear strain. First, the shear deformation process of a large area in the specimen was accurately examined and proven to exhibit an almost perfect simple shear. At the nanoscale, voids grew along the maximum principal strain during shear deformation. In addition, the nanoscale regions with rubber and silica aggregates exhibited deformation behaviours similar to the global shear deformation of the specimen. Although the silica aggregates exhibited displacement along the shearing directions, rotational motions were also observed owing to the torque generated by the local shear stress. This in-situ shear deformation system for TEM enabled us to understand the nanoscale origins of the mechanical properties of soft materials, particularly polymer composites.Graphical Abstract
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