期刊
NANOSCALE
卷 8, 期 15, 页码 7978-7983出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/c6nr00602g
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类别
资金
- MOST [2013CBA01604]
- MOE [20120141110054]
- NSFC [61222402, 61376085, 61574101]
- National Laboratory of Infrared Physics in the Shanghai Institute of Technical Physics [Z201402]
- Hong Kong Research Grant Council [GRF 623112]
Solution-processed amorphous oxide semiconductors have attracted considerable interest in large-area transparent electronics. However, due to its relative low carrier mobility (similar to 10 cm(2) V-1 s(-1)), the demonstrated circuit performance has been limited to 800 kHz or less. Herein, we report solution-processed high-speed thin-film transistors (TFTs) and integrated circuits with an operation frequency beyond the megahertz region on 4 inch glass. The TFTs can be fabricated from an amorphous indium gallium zinc oxide/single-walled carbon nanotube (a-IGZO/SWNT) composite thin film with high yield and high carrier mobility of > 70 cm(2) V-1 s(-1). On-chip microwave measurements demonstrate that these TFTs can deliver an unprecedented operation frequency in solution-processed semiconductors, including an extrinsic cutoff frequency (f(T) = 102 MHz) and a maximum oscillation frequency (f(max) = 122 MHz). Ring oscillators further demonstrated an oscillation frequency of 4.13 MHz, for the first time, realizing megahertz circuit operation from solution-processed semiconductors. Our studies represent an important step toward high-speed solution-processed thin film electronics.
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