Limitations of the Cutoff Frequency technique for Sizing Defects with Guided Waves and a Potential Path Forward

标题
Limitations of the Cutoff Frequency technique for Sizing Defects with Guided Waves and a Potential Path Forward
作者
关键词
-
出版物
MATERIALS EVALUATION
Volume 81, Issue 8, Pages 47-58
出版商
The American Society for Nondestructive Testing, Inc.
发表日期
2023-10-12
DOI
10.32548/2023.me-04338

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now