Field‐dependent abundances of hydride molecular ions in atom probe tomography of III‐N semiconductors

Surface Dynamics of Field Evaporation in Silicon Carbide

(2023) Samba Ndiaye et al.   Journal of Physical Chemistry C

Dopant-defect interactions in Mg-doped GaN via atom probe tomography

(2021) Olivia G. Licata et al.   APPLIED PHYSICS LETTERS

Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors

(2021) Lorenzo Rigutti et al.   Journal of Physical Chemistry C

Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography

(2020) Marcus Hans et al.   NEW JOURNAL OF PHYSICS

Quantification Challenges for Atom Probe Tomography of Hydrogen and Deuterium in Zircaloy-4

(2019) Isabelle Mouton et al.   MICROSCOPY AND MICROANALYSIS

Quantification of solute deuterium in titanium deuteride by atom probe tomography with both laser pulsing and high-voltage pulsing: influence of the surface electric field

(2019) Y H Chang et al.   NEW JOURNAL OF PHYSICS

A Toolchain for the Analysis of Hydrogen in Materials at the Atomic Scale

(2019) Peter Johann Felfer   MICROSCOPY AND MICROANALYSIS

Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography

(2019) Lynda Amichi et al.   NANOTECHNOLOGY

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

(2018) E. Di Russo et al.   Journal of Physical Chemistry C

Direct observation of individual hydrogen atoms at trapping sites in a ferritic steel

(2017) Y.-S. Chen et al.   SCIENCE

Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls

(2016) L. Mancini et al.   APPLIED PHYSICS LETTERS

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

(2016) L. Rigutti et al.   JOURNAL OF APPLIED PHYSICS

Behavior of molecules and molecular ions near a field emitter

(2016) Baptiste Gault et al.   NEW JOURNAL OF PHYSICS

Accuracy of analyses of microelectronics nanostructures in atom probe tomography

(2016) F Vurpillot et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Tuning the Performance and the Stability of Porous Hollow PtNi/C Nanostructures for the Oxygen Reduction Reaction

(2015) Laetitia Dubau et al.   ACS Catalysis

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

(2014) Lorenzo Mancini et al.   Journal of Physical Chemistry C

Atom probe analysis of AlN interlayers in AlGaN/AlN/GaN heterostructures

(2013) Baishakhi Mazumder et al.   APPLIED PHYSICS LETTERS

Advance in multi-hit detection and quantization in atom probe tomography

(2012) G. Da Costa et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Direct observation of hydrogen-trapping sites in vanadium carbide precipitation steel by atom probe tomography

(2012) Jun Takahashi et al.   SCRIPTA MATERIALIA

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography

(2010) B. Gault et al.   JOURNAL OF APPLIED PHYSICS

Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice

(2010) S.E. Bennett et al.   ULTRAMICROSCOPY

Quantitative atom probe analysis of carbides

(2010) M. Thuvander et al.   ULTRAMICROSCOPY

Advances in the calibration of atom probe tomographic reconstruction

(2009) Baptiste Gault et al.   JOURNAL OF APPLIED PHYSICS