期刊
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
卷 19, 期 8, 页码 8614-8624出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TII.2022.3220889
关键词
Blade profile registration; deep learning; feature interaction; optical measurement
This article proposes a deep feature interaction network for fine registration of multiview data, specifically designed for the thin-walled and twisted spatial freeform surfaces of blades. The network uses a two-branch structure to integrate global and local feature extraction branches and a feature interaction module to strengthen information association between two point clouds. Experimental results demonstrate the feasibility and good practical application prospect of this method.
Optical measurement methods for blade profiles attract lots of interest in industry. Due to the nature of the thin-walled and twisted spatial freeform surfaces of blades, the measurement accuracy would be significantly affected by the accumulated error associated with the geometric accuracy and motion stability of the developed multiview system. To overcome these issues, this article proposes a deep feature interaction network for fine registration of the multiview data. In our network, we design a two-branch structure to integrate a global and a local feature extraction branch to encode point cloud features. Moreover, we propose a feature interaction module to strengthen information association between two point clouds during feature extraction. Next, an attention mechanism is used to fuse matching information between two matching matrices obtained from the global-based and the local-based features. Experimental results demonstrate the feasibility and good practical application prospect of this method.
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