Structural and electrical properties of SnS2 thin films

标题

作者

关键词

Thin films, Chalcogenides, Electron microscopy, Semiconductors, Raman spectroscopy and scattering, Electrical properties

出版物

Volume 173, Issue -, Pages 52-61

出版商

Elsevier BV

发表日期

2016-01-23

DOI

10.1016/j.matchemphys.2016.01.036

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