4.7 Article

Characterizing defect structures in AM steel using direct electron detection EBSD

期刊

SCRIPTA MATERIALIA
卷 221, 期 -, 页码 -

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2022.114952

关键词

Electron backscatter diffraction; Additive manufacturing; Dislocation structure

资金

  1. U.S. Department of Energy (DOE) , Office of Science, Basic Energy Sciences (BES) Materials Science and Engineering (MSE) Division [DE-SC0018960]
  2. Laboratory Directed Research and Development program at Sandia National Laboratories
  3. U.S. Department of Energy's National Nuclear Security Administration [DE-NA0003525]
  4. U.S. Department of Energy (DOE) [DE-SC0018960] Funding Source: U.S. Department of Energy (DOE)

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This study demonstrates the ability to quantitatively characterize the dislocation structures in additive and traditionally manufactured alloys, and discusses potential defect formation mechanisms using high angular resolution electron backscatter diffraction analysis.
The mechanical properties of additive and traditionally manufactured alloys are largely dependent on the characteristics and distribution of dislocation cell networks that develop during the fabrication process. This work demonstrates the ability to quantitatively characterize these dislocation structures by high angular reso-lution electron backscatter diffraction analysis using a direct electron detector. The defect structures are char-acterized in terms of the geometrically necessary dislocation density and the associated Burgers vector and line direction. The results are discussed in terms of potential defect formation mechanisms.

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