4.7 Article

Subgrain geometrically necessary dislocation density mapping in spalled Ta in three dimensions

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ACTA MATERIALIA
卷 244, 期 -, 页码 -

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PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2022.118366

关键词

A; Dislocations; Microstructures; B; Metallic material; Polycrystalline material; Three-Dimensional Electron Backscatter; Diffraction

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This study investigates the intragranular distributions of geometrically necessary dislocations (GNDs) in a polycrystalline tantalum sample under shock compression loading. Using TriBeam tomography, a highly resolved 3D map of the microstructure was obtained, allowing for the examination of grain boundaries, orientations, and voids. By combining the 3D characterization, GND formulation, and a sample with approximately 6000 grains, correlations between GND density per grain and grain characteristics were analyzed. The results show that GND density increases closer to the spall plane and that grains containing voids have high GND density concentrations in the intragranular region surrounding the void.
In this work, the intragranular distributions of the densities of geometrically necessary dislocations (GNDs) generated in a polycrystalline tantalum (Ta) sample loaded in shock compression to spall are investigated. The sample studied is a highly resolved three-dimensional (3D) map of the orientations, grain boundary morphology, and voids across a 0.276mm3 (with sample dimensions of 688.5 mu m x 669 mu m x 600 mu m) region of the micro-structure about the spall plane obtained by TriBeam tomography. We present a formulation for calculating the crystallographic screw and edge character GND densities at a material point within body centered cubic (BCC) crystals when provided any number of potential slip systems or modes. Combining the 3D characterization, GND formulation, and a sample containing approximate to 6000 grains, we sought statistically relevant correlations between GND density per grain with grain size, grain orientation, void formation, and proximity from the spall plane. We show that GND density per grain increases with decreasing distance from the spall plane. Most grains had heteroge-neously distributed GND densities but were free of any detectable voids, at least within the approximate to 1.5 mu m resolution of the characterization technique. It is found that the GND density for most grains is insensitive to grain size and grain orientation. Only the fraction of grains with the highest GND densities tended to have a [001] parallel to shock-direction orientation. Intragranular 3D maps of GNDs reveals that grains that contain voids have high GND density concentrations in the intragranular region immediately surrounding the void. The local intragranular GND mapping also showed voids that are connected to grain boundaries preferred to grow into the grain with the larger size, regardless of orientation.

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