Litho-NeuralODE 2.0: Improving hotspot detection accuracy with advanced data augmentation, DCT-based features, and neural ordinary differential equations

VLSI mask optimization: From shallow to deep learning

(2020) Haoyu Yang et al.   INTEGRATION-THE VLSI JOURNAL

Lithography hotspot detection using a double inception module architecture

(2019) Jing Chen et al.   Journal of Micro-Nanolithography MEMS and MOEMS

Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies

(2019) Bernhard Lippmann et al.   INTEGRATION-THE VLSI JOURNAL

Layout Hotspot Detection with Feature Tensor Generation and Deep Biased Learning

(2018) Haoyu Yang et al.   IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Cross-Validation for Imbalanced Datasets: Avoiding Overoptimistic and Overfitting Approaches [Research Frontier]

(2018) Miriam Seoane Santos et al.   IEEE Computational Intelligence Magazine

Learning from class-imbalanced data: Review of methods and applications

(2017) Guo Haixiang et al.   EXPERT SYSTEMS WITH APPLICATIONS

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

(2017) Ki Bum Lee et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Automated diagnostics for manufacturing machinery based on well-regularized deep neural networks

(2017) Robert DiBiano et al.   INTEGRATION-THE VLSI JOURNAL

Imbalance aware lithography hotspot detection: a deep learning approach

(2017) Haoyu Yang et al.   Journal of Micro-Nanolithography MEMS and MOEMS

Optical proximity correction with hierarchical Bayes model

(2016) Tetsuaki Matsunawa et al.   Journal of Micro-Nanolithography MEMS and MOEMS

Accurate lithography hotspot detection using deep convolutional neural networks

(2016) Moojoon Shin et al.   Journal of Micro-Nanolithography MEMS and MOEMS

Design for manufacturability and reliability in extreme-scaling VLSI

(2016) Bei Yu et al.   Science China-Information Sciences

Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction

(2015) Yen-Ting Yu et al.   IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Spatial Pyramid Pooling in Deep Convolutional Networks for Visual Recognition

(2015) Kaiming He et al.   IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE

A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection

(2014) Wan-Yu Wen et al.   IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Design for Manufacturing With Emerging Nanolithography

(2013) David Z. Pan et al.   IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Fast and scalable parallel layout decomposition in double patterning lithography

(2013) Wei Zhao et al.   INTEGRATION-THE VLSI JOURNAL

Pixel-based OPC optimization based on conjugate gradients

(2011) Xu Ma et al.   OPTICS EXPRESS

Efficient range pattern matching algorithm for process-hotspot detection

(2008) H. Yao et al.   IET Circuits Devices & Systems

Application of optical proximity correction technology

(2008) YiCi Cai et al.