4.3 Article

Integrating the probability integral method for subsidence prediction and differential synthetic aperture radar interferometry for monitoring mining subsidence in Fengfeng, China

期刊

JOURNAL OF APPLIED REMOTE SENSING
卷 10, 期 -, 页码 -

出版社

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.JRS.10.016028

关键词

mining subsidence; monitoring; probability integral method; subsidence prediction; D-InSAR

资金

  1. Priority Academic Program Development of the Jiangsu Higher Education Institutions (PAPD) [SZBF2011-6-B35]
  2. Natural Science Foundation of Jiangsu Province [BK20150187]
  3. Scientific Research Foundation of the Jiangsu Key Laboratory of Resources and Environmental Information Engineering (China University of Mining and Technology) [JS201109]

向作者/读者索取更多资源

Differential synthetic aperture radar interferometry (D-InSAR) is characterized mainly by high spatial resolution and high accuracy over a wide coverage range. Because of its unique advantages, the technology is widely used for monitoring ground surface deformations. However, in coal mining areas, the ground surface can suffer large-scale collapses in short periods of time, leading to inaccuracies in D-InSAR results and limiting its use for monitoring mining subsidence. We propose a data-processing method that overcomes these disadvantages by combining D-InSAR with the probability integral method used for predicting mining subsidence. Five RadarSat-2 images over Fengfeng coal mine, China, were used to demonstrate the proposed method and assess its effectiveness. Using this method, surface deformation could be monitored over an area of thousands of square kilometers, and more than 50 regions affected by subsidence were identified. For Jiulong mine, nonlinear subsidence cumulative results were obtained for a time period from January 2011 to April 2011, and the maximum subsidence value reached up to 299 mm. Finally, the efficiency and applicability of the proposed method were verified by comparing with data from leveling surveying. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)

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