Optical, structural, morphological and compositional characterization of a Co-doped GaAs semiconducting thin film produced by thermionic vacuum arc

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标题

作者

关键词

Thermionic vacuum arc, GaAs, XRD, FESEM, AFM

出版物

JOURNAL OF ALLOYS AND COMPOUNDS

Volume 663, Issue -, Pages 829-833

出版商

Elsevier BV

发表日期

2015-12-23

DOI

10.1016/j.jallcom.2015.12.154

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