期刊
IEEE ELECTRON DEVICE LETTERS
卷 43, 期 5, 页码 753-756出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2022.3158552
关键词
Gallium arsenide (GaAs); avalanche multiplication; electric-field screening; pulse compression
资金
- National Natural Science Foundational of China [51877177, 52007152]
- Shaanxi Provincial Education Department [21JP085, 21JP088, 19JC032]
- Youth Innovation Team of Shaanxi Universities
- Natural Science Basic Research Plan of Shaanxi Province [2021JZ-48, 2020JM-462]
- China Postdoctoral Science Foundation [2021M702639]
- State Key Laboratory of Pulsed Power Laser Technology [SKL2020KF01]
The investigation of nonlinear transient characteristics of gallium arsenide (GaAs) photoconductive semiconductor switches (PCSS) is of great significance for its applications in pulsed power technology. In this study, the researchers employed a laser diode (LD) with an energy of 2 mu J to trigger the GaAs PCSS. They observed compressed pulse width and increased amplitude as the bias electric field increased. Numerical modeling revealed that these effects can be attributed to negative differential mobility (NDM) and electric-field screening (EFS). The compression of pulse width provides the potential for relieving heat accumulation and suppressing device failure for high-repetition-rate applications.
The investigation of nonlinear transient characteristics of gallium arsenide (GaAs) photoconductive semiconductor switches (PCSS) is of great significance for its applications in pulsed power technology. In this letter, the laser diode (LD) energy of 2 mu J is employed to trigger the opposed-electrode GaAs PCSS. The compressed pulse width and increased amplitude are obtained as the bias electric field increases from 6kV/cm to 34kV/cm. It is numerically modeled the transient electric field distribution along the photogenerated carriers' transport. Results reveal that pulse compression effect (PCE) can be attributed to the negative differential mobility (NDM) and electric-field screening (EFS) effect. The compression of pulse width on time scale provides a possibility to relieve the heat accumulation on time scale, and further to suppress the device failure for the potential high-repetition-rate applications.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据