Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

标题
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
作者
关键词
-
出版物
Jove-Journal of Visualized Experiments
Volume -, Issue 176, Pages -
出版商
MyJove Corporation
发表日期
2021-10-26
DOI
10.3791/62886

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