Depth profiling characterization of the nitride layers on gas nitrided commercially pure titanium

标题
Depth profiling characterization of the nitride layers on gas nitrided commercially pure titanium
作者
关键词
Gas nitriding, Titanium nitride (TiN, x, ), Ti, 2, N, Diffusion zone, Nitrogen depth profile, X-ray photoelectron spectroscopy (XPS)
出版物
MATERIALS CHARACTERIZATION
Volume 181, Issue -, Pages 111453
出版商
Elsevier BV
发表日期
2021-09-24
DOI
10.1016/j.matchar.2021.111453

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