Locating Inter-Turn Faults in Transformer Windings Using Isometric Feature Mapping of Frequency Response Traces

标题
Locating Inter-Turn Faults in Transformer Windings Using Isometric Feature Mapping of Frequency Response Traces
作者
关键词
-
出版物
IEEE Transactions on Industrial Informatics
Volume 17, Issue 10, Pages 6962-6970
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2020-08-18
DOI
10.1109/tii.2020.3016966

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