Influence of Annealing on Solution-Processed Indium Oxide Thin-Film Transistors Under Ambient Air and Wet Conditions

出版年份 2016 全文链接

标题

作者

关键词

出版物

Volume 63, Issue 9, Pages 3558-3561

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2016-08-25

DOI

10.1109/ted.2016.2591622

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