Unraveling the Electrical and Magnetic Properties of Layered Conductive Metal-Organic Framework With Atomic Precision

This paper describes structural elucidation of a layered conductive metal-organic framework (MOF) material Cu-3(C6O6)(2) by microcrystal electron diffraction with sub-angstrom precision. This insight enables the first identification of an unusual pi-stacking interaction in a layered MOF material characterized by an extremely short (2.73 angstrom) close packing of the ligand arising from pancake bonding and ordered water clusters within pores. Band structure analysis suggests semiconductive properties of the MOF, which are likely related to the localized nature of pancake bonds and the formation of a singlet dimer of the ligand. The spin of Cu-II within the Kagome arrangement dominates the paramagnetism of the MOF, leading to strong geometrical magnetic frustration.

Automated summary

This paper investigates the structural elucidation of a layered conductive metal-organic framework (MOF) material, revealing unusual pi-stacking interaction and semiconductive properties, while exploring the influence of Cu-II spin on the magnetic properties of the MOF.