Switching Dynamics and Hot Atom Damage in Landau Switches

标题
Switching Dynamics and Hot Atom Damage in Landau Switches
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume -, Issue -, Pages 1-1
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2016-05-04
DOI
10.1109/led.2016.2562007

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