In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Reduction of Influence of the High-Frequency Noise on the Results of Surface Topography Measurements

(2021) Przemysław Podulka   Materials

Investigating the Trackability of Silicon Microprobes in High-Speed Surface Measurements

(2021) Min Xu et al.   SENSORS

A new evaluation method for interferometric surface topography measurements which is robust against environmental disturbances

(2021) Özgür Tan et al.   CIRP Journal of Manufacturing Science and Technology

State-of-the-art active optical techniques for three-dimensional surface metrology: a review [Invited]

(2020) Andres G. Marrugo et al.   JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION

Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm

(2019) Uwe Brand et al.   SENSORS

Correlating and evaluating the functionality-related properties with surface texture parameters and specific characteristics of machined components

(2018) Quanren Zeng et al.   INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES

High-speed microprobe for roughness measurements in high-aspect-ratio microstructures

(2017) Lutz Doering et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Application of Monte Carlo simulation for estimation of uncertainty of four-point roundness measurements of rolls

(2017) T. Widmaier et al.   PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

Integration of a silicon-based microprobe into a gear measuring instrument for accurate measurement of micro gears

(2014) N Ferreira et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Characterization of the main error sources of chromatic confocal probes for dimensional measurement

(2014) H Nouira et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Tactile probes for dimensional metrology with microcomponents at nanometre resolution

(2008) E Peiner et al.   MEASUREMENT SCIENCE and TECHNOLOGY