4.6 Article

An Efficient and Robust Target Detection Algorithm for Identifying Minor Defects of Printed Circuit Board Based on PHFE and FL-RFCN

期刊

FRONTIERS IN PHYSICS
卷 9, 期 -, 页码 -

出版社

FRONTIERS MEDIA SA
DOI: 10.3389/fphy.2021.661091

关键词

printed circuit board; minor defect; data enhancement; focal loss; high-definition feature extraction

资金

  1. National Key Research and Development Program of China [2017YFB1103200]
  2. National Natural Science Foundation of China [41974033, 61803208]
  3. Scientific and Technological Achievements Program of Jiangsu Province [BA2020004]
  4. 2020 Industrial Transformation and Upgrading Project of Industry and Information Technology Department of Jiangsu Province
  5. Postgraduate Research & Practice Innovation Program of Jiangsu Province [KYCX20_1257]

向作者/读者索取更多资源

This paper proposes a new PCB minor defect detection method based on FL-RFCN and PHFE, which improves the recognition rate of minor defects and mAP accuracy by using R-FCN, focal loss, and parallel high-definition feature extraction.
For ensuring the safety and reliability of electronic equipment, it is a necessary task to detect the surface defects of the printed circuit board (PCB). Due to the smallness, complexity and diversity of minor defects of PCB, it is difficult to identify minor defects in PCB with traditional methods. And the target detection method based on deep learning faces the problem of imbalance between foreground and background when detecting minor defects. Therefore, this paper proposes a minor defect detection method on PCB based on FL-RFCN (focal loss and Region-based Fully Convolutional Network) and PHFE (parallel high-definition feature extraction). Firstly, this paper uses the Region-based Fully Convolutional Network(R-FCN) to identify minor defects on the PCB. Secondly, the focal loss is used to solve the problem of data imbalance in neural networks. Thirdly, the parallel high-definition feature extraction algorithm is used to improve the recognition rate of minor defects. In the detection of minor defects on PCB, the ablation experiment proves that the mean Average accuracy (mAP) of the proposed method is increased by 7.4. In comparative experiments, it is found that the mAP of the method proposed in this paper is 12.3 higher than YOLOv3 and 6.7 higher than Faster R-CNN.

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