期刊
PHYSICAL REVIEW MATERIALS
卷 5, 期 4, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevMaterials.5.043604
关键词
-
资金
- NSF CAREER Program
- NSF [DMR 1654065]
- Department of Materials Science and Engineering at UIUC
This study traces the formation and morphological characteristics of slip lines in high-entropy alloys, revealing two main types of events related to slip lines. The combination of these events represents the highest degree of spatial avalanche delocalization across the entire sample, linking the statistics of dislocation avalanches to a microstructural observable.
Here, we trace in situ the slip-line formation and morphological signature of dislocation avalanches in a high-entropy alloy with the aim of revealing their microstructural degree of localization. Correlating the intermittent microplastic events with their corresponding slip-line patterns allows defining two main event types, one of which is linked to the formation of new slip lines, whereas the other one involves reactivation of already existing slip lines. The formation of new slip lines reveals statistically larger and faster avalanches. The opposite tendency is seen for avalanches involving reactivation of already existing slip lines. The combination of both these types of events represents the highest degree of spatial avalanche delocalization that spans the entire sample, forming a group of events that determine the truncation length scale of the truncated power-law scaling. These observations link the statistics of dislocation avalanches to a microstructural observable.
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