期刊
SCIENTIFIC REPORTS
卷 11, 期 1, 页码 -出版社
NATURE RESEARCH
DOI: 10.1038/s41598-021-85938-4
关键词
-
资金
- National Science Foundation [DMR-1552871, ECCS-1653032]
The 2D material silicon phosphide (SiP) shows promising optical properties, including a large band gap, fast photoresponse, and strong anisotropy. The study investigates the thickness-dependent in-plane anisotropic third-harmonic generation (THG) from mechanically exfoliated 2D SiP flakes, revealing a strong anisotropic angular dependence of THG emission with respect to incident linear polarization.
Two-dimensional (2D) material of silicon phosphide (SiP) has recently been shown as a promising optical material with large band gap, fast photoresponse and strong anisotropy. However, the nonlinear optical properties of 2D SiP have not been investigated yet. Here, the thickness-dependent in-plane anisotropic third-harmonic generation (THG) from the mechanically exfoliated 2D layered SiP flakes is reported. The crystal orientation of the SiP flake is determined by the angle-resolved polarized Raman spectroscopy. The angular dependence of the THG emission with respect to the incident linear polarization is found to be strongly anisotropic with the two-fold polarization dependence pattern. Furthermore, the effect of the SiP flake thickness on the THG power is analyzed.
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