Defects signature in VOC characterization of thin-film solar cells

标题
Defects signature in VOC characterization of thin-film solar cells
作者
关键词
V, OC, -illumination, V, OC, -temperature, Bulk defect, SRV, Hole mobility, Contact barrier, Simulation
出版物
SOLAR ENERGY
Volume 220, Issue -, Pages 35-42
出版商
Elsevier BV
发表日期
2021-03-25
DOI
10.1016/j.solener.2021.03.017

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