Cross-correlated sine-Wiener bounded noises-induced logical stochastic resonance

Noise improves the reliability of logic operations if noise parameter is in certain proper region (reliable region), which is known as logical stochastic resonance (LSR). LSR attracts much attention due to its potential application in new-style logic devices. However, nothing is reported about the effect of cross-correlated sine-Wiener (CCSW) bounded noises on the reliability and agility of logic operations. Here we explicitly demonstrate that in certain proper parameter regions of amplitude and correlation time of CCSW noises, CCSW noises can induce LSR. In addition, cross-correlation intensity of CCSW noises can drastically influence the range of reliable region. By comparison, moderate cross-correlation intensity can drastically destroy the reliability of the logic system, and strongly shrink the optimal parameter ranges, depending on cross-correlation time and amplitude. Moreover, for given amplitudes and cross-correlation time, a little faster logic operation can be obtained with increasing cross-correlation intensity.

Automated summary

This study investigates the impact of cross-correlated sine-Wiener (CCSW) bounded noises on the reliability and agility of logic operations, demonstrating that in certain parameter regions, CCSW noises can induce logical stochastic resonance (LSR). Furthermore, the cross-correlation intensity of CCSW noises significantly influences the range of reliable region.