Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution

标题
Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution
作者
关键词
-
出版物
Physical Review Accelerators and Beams
Volume 24, Issue 2, Pages -
出版商
American Physical Society (APS)
发表日期
2021-02-16
DOI
10.1103/physrevaccelbeams.24.022802

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