Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)

标题
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)
作者
关键词
Atomic force microscopy, Scanning spreading resistance microscopy, Microscope image processing, Two-phase materials
出版物
ULTRAMICROSCOPY
Volume 222, Issue -, Pages 113212
出版商
Elsevier BV
发表日期
2021-01-18
DOI
10.1016/j.ultramic.2021.113212

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