4.6 Review

Review on Strain Localization Phenomena Studied by High-Resolution Digital Image Correlation

期刊

ADVANCED ENGINEERING MATERIALS
卷 23, 期 4, 页码 -

出版社

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adem.202001409

关键词

digital image correlation; magnitude of shear; scanning electron microscopy; strain fields; strain localizations

资金

  1. CRC799 TRIP matrix composites by the German Research Foundation (Deutsche Forschungsgemeinschaft) [54434667]
  2. Projekt DEAL

向作者/读者索取更多资源

This comprehensive review focuses on the application of digital image correlation (DIC) in investigating strain localization phenomena in materials science and engineering. The review is divided into three parts, covering the basic principles, application in MSE, and high-resolution results obtained in combination with SEM for high-strength steels. Overall, the review emphasizes the capabilities and limitations of DIC in analyzing displacement and strain fields.
Herein, a comprehensive review on the application of digital image correlation (DIC) for investigations of strain localization phenomena in the field of materials science and engineering (MSE) is provided. The Review is divided into three parts. In Part 1, the method of DIC is reviewed in terms of basic principles, correlation algorithms, and sources of errors. Part 2 is focused on the application of DIC in the field of MSE. This part is subdivided into the application of DIC in 1) combination with optical microscopy and 2) in combination with scanning electron microscopy (SEM). In Part 3, results of high-resolution DIC obtained in combination with SEM are presented for high-strength austenitic stainless steels-transformation-induced plasticity steels and twinning-induced plasticity steels-exhibiting microscopic strain localization phenomena. These investigations are supplemented by electron backscattered diffraction for interpretation of strain fields. Although DIC allows for both 2D and 3D calculations of displacement and strain fields, herein, 2D digital correlation is referred to only, as in particular with SEM only in-plane displacements are calculated so far.

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