On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon

出版年份 2021 全文链接

标题

On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon

作者

关键词

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出版物

ACS Applied Materials & Interfaces

Volume -, Issue -, Pages -

出版商

American Chemical Society (ACS)

发表日期

2021-01-27

DOI

10.1021/acsami.0c17549

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