The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials

标题
The universal sample holders of microanalytical instruments of FIB, TEM, NanoSIMS, and STXM-NEXAFS for the coordinated analysis of extraterrestrial materials
作者
关键词
-
出版物
EARTH PLANETS AND SPACE
Volume 72, Issue 1, Pages -
出版商
Springer Science and Business Media LLC
发表日期
2020-09-14
DOI
10.1186/s40623-020-01267-2

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