X-ray photoelectron spectroscopic studies of CeO2 thin films deposited on Ni-W (100), c-Al2O3 (0001) and Si (100) substrates

出版年份 2016 全文链接

标题

作者

关键词

CeO, 2, thin film, Magnetron sputtering, Biaxially textured Ni-W substrate, XPS, UPS

出版物

CURRENT APPLIED PHYSICS

Volume 16, Issue 10, Pages 1388-1394

出版商

Elsevier BV

发表日期

2016-07-26

DOI

10.1016/j.cap.2016.07.013

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