Electric field cycling-mediated variations in defect distributions associated with wake-up and split-up behaviors of a ferroelectric Si-doped HfO2 thin film
出版年份 2020 全文链接
标题
Electric field cycling-mediated variations in defect distributions associated with wake-up and split-up behaviors of a ferroelectric Si-doped HfO2 thin film
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 117, Issue 16, Pages 162903
出版商
AIP Publishing
发表日期
2020-10-19
DOI
10.1063/5.0024745
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