Surface Defect Detection Using Image Pyramid

标题
Surface Defect Detection Using Image Pyramid
作者
关键词
-
出版物
IEEE SENSORS JOURNAL
Volume 20, Issue 13, Pages 7181-7188
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2020-03-03
DOI
10.1109/jsen.2020.2977366

向作者/读者发起求助以获取更多资源

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started