Multiparametric characterization of heterogeneous soft materials using contact point detection-based atomic force microscopy

标题
Multiparametric characterization of heterogeneous soft materials using contact point detection-based atomic force microscopy
作者
关键词
Atomic force microscopy, Contact point detection, Multiparametric mapping, Force-distance curve-based AFM
出版物
APPLIED SURFACE SCIENCE
Volume 522, Issue -, Pages 146423
出版商
Elsevier BV
发表日期
2020-04-23
DOI
10.1016/j.apsusc.2020.146423

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