Stress-relieving defects enable ultra-stable silicon anode for Li-ion storage

出版年份 2020 全文链接

标题

作者

关键词

Li-ion storage, Ultra-stable silicon anode, Stress-relieving defects, In situ, TEM

出版物

Volume 70, Issue -, Pages 104568

出版商

Elsevier BV

发表日期

2020-02-04

DOI

10.1016/j.nanoen.2020.104568

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