Fluorometric Detection of Low-Abundance EGFR Exon 19 Deletion Mutation Using Tandem Gene Amplification

标题
Fluorometric Detection of Low-Abundance EGFR Exon 19 Deletion Mutation Using Tandem Gene Amplification
作者
关键词
-
出版物
JOURNAL OF MICROBIOLOGY AND BIOTECHNOLOGY
Volume 30, Issue 5, Pages 662-667
出版商
Korean Society for Microbiology and Biotechnology
发表日期
2020-05-29
DOI
10.4014/jmb.2004.04010

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started