High dielectric ternary oxides from crystal structure prediction and high-throughput screening

Measurement(s)high dielectric ternary oxidesTechnology Type(s)computational modeling technique center dot high throughput sample analysis Machine-accessible metadata file describing the reported data: 10.6084/m9.figshare.11698986 The development of new high dielectric materials is essential for advancement in modern electronics. Oxides are generally regarded as the most promising class of high dielectric materials for industrial applications as they possess both high dielectric constants and large band gaps. Most previous researches on high dielectrics were limited to already known materials. In this study, we conducted an extensive search for high dielectrics over a set of ternary oxides by combining crystal structure prediction and density functional perturbation theory calculations. From this search, we adopted multiple stage screening to identify 441 new low-energy high dielectric materials. Among these materials, 33 were identified as potential high dielectrics favorable for modern device applications. Our research has opened an avenue to explore novel high dielectric materials by combining crystal structure prediction and high throughput screening.