Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations

标题
Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 209, Issue -, Pages 112884
出版商
Elsevier BV
发表日期
2019-11-05
DOI
10.1016/j.ultramic.2019.112884

向作者/读者发起求助以获取更多资源

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now