4.8 Article

DNA origami mediated electrically connected metal-semiconductor junctions

期刊

NANO RESEARCH
卷 13, 期 5, 页码 1419-1426

出版社

TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-020-2672-5

关键词

current-voltage measurement; DNA nanofabrication; electroless plating; gold nanorods; nanoelectronics; tellurium nanorods

资金

  1. National Science Foundation [1562729]
  2. BYU's Simmons Research Endowment
  3. BYU Department of Chemistry and Biochemistry
  4. Div Of Civil, Mechanical, & Manufact Inn
  5. Directorate For Engineering [1562729] Funding Source: National Science Foundation

向作者/读者索取更多资源

DNA-based nanofabrication of inorganic nanostructures has potential application in electronics, catalysis, and plasmonics. Previous DNA metallization has generated conductive DNA-assembled nanostructures; however, the use of semiconductors and the development of well-connected nanoscale metal-semiconductor junctions on DNA nanostructures are still at an early stage. Herein, we report the first fabrication of multiple electrically connected metal-semiconductor junctions on individual DNA origami by location-specific binding of gold and tellurium nanorods. Nanorod attachment to DNA origami was via DNA hybridization for Au and by electrostatic interaction for Te. Electroless gold plating was used to create nanoscale metal-semiconductor interfaces by filling the gaps between Au and Te nanorods. Two-point electrical characterization indicated that the Au-Te-Au junctions were electrically connected, with current-voltage properties consistent with a Schottky junction. DNA-based nanofabrication of metal-semiconductor junctions opens up potential opportunities in nanoelectronics, demonstrating the power of this bottom-up approach.

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