Exploiting the Semidestructive Nature of Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Imaging for Simultaneous Localization and Confident Lipid Annotations

标题
Exploiting the Semidestructive Nature of Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Imaging for Simultaneous Localization and Confident Lipid Annotations
作者
关键词
-
出版物
ANALYTICAL CHEMISTRY
Volume 91, Issue 23, Pages 15073-15080
出版商
American Chemical Society (ACS)
发表日期
2019-10-29
DOI
10.1021/acs.analchem.9b03763

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