4.8 Article

Approaching the Collection Limit in Hot Electron Transistors with Ambipolar Hot Carrier Transport

期刊

ACS NANO
卷 13, 期 12, 页码 14191-14197

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.9b07020

关键词

hot electron transistors; hot carriers; collection limit; ambipolar; two-dimensional materials

资金

  1. Fundamental Research Funds for the Central Universities [2019QNA5009]
  2. NSFC [61674127, 61874094]
  3. ZJ-NSF [LZ17F040001]
  4. National Key Basic Research Program of China [2016YFA0200204, 2016YFA0301204]
  5. ZJU Micro-Nano Fabrication Center

向作者/读者索取更多资源

Hot electron transistors (HETs) containing two-dimensional (2D) materials promise great potential in high-frequency analog and digital applications. Here, we experimentally demonstrate all-2D van der Waals (vdW) HETs formed by graphene, hBN, and WSe2, in which the polarity of carriers could be tuned by changing bias conditions. We proposed a theoretical model to distinguish hot hole and hot electron components in the ambipolar vdW HET. Importantly, both hot hole and hot electron modes are achieved with pronounced saturation behavior as well as record-high collection efficiency approaching theoretical limits (99.9%) at room temperature. The vdW HETs show a maximum output current density of 400 A/cm(2). The observed ambipolar hot carrier transport with high collection efficiency is promising for high-speed nanoelectronics and 2D hot electron spectroscopy.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.8
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据