Improved applicability and robustness of fast cryo-electron tomography data acquisition

出版年份 2019 全文链接

标题

作者

关键词

Cryo-electron tomography, Electron cryotomography, Cryo-EM, Tilt series, Data acquisition, Throughput, K2, K3, Calibration

出版物

Volume -, Issue -, Pages -

出版商

Elsevier BV

发表日期

2019-08-16

DOI

10.1016/j.jsb.2019.08.006

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