期刊
IEEE ELECTRON DEVICE LETTERS
卷 40, 期 9, 页码 1495-1498出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2019.2928027
关键词
Normally-off; HEMT; regrown p-GaN gate; LPCVD SiNx; passivation
资金
- National Key Research and Development Program [2016YFB0400100, 2016YFB0400104]
- National Natural Science Foundation of China [61534007, 61604168, 61775230, 61804162, 61874131]
- Key Frontier Scientific Research Program of the Chinese Academy of Sciences (CAS) [QYZDB-SSW-JSC014]
- CAS Interdisciplinary Innovation Team
- Key Research and Development Program of Jiangsu Province [BE2017079]
- Natural Science Foundation of Jiangsu Province [BK20160401, BK20180253]
- Natural Science Foundation of Jiangxi Province [20181ACB20002, 20181BAB211022]
- Suzhou Science and Technology Program [SYG201725, SYG201846]
- China Postdoctoral Science Foundation [2018M632408]
- Open Fund of the State Key Laboratory of Reliability and Intelligence of Electrical Equipment [EERIKF2018001]
Normally-off HEMTs have been fabricated with regrown p-GaN gate and SiNx passivation by Low-pressure chemical vapor deposition (LPCVD) using an AIN pre-layer, featuring a high-temperature passivation-first technique with no incompatibility issues. Through careful surface treatments, high-quality interfaces (regrown p-GaN/AIGaN and SiNx/ AIGaN), as well as a stable p-GaN contact, can be achieved, enabling a robust gate operation and improved dynamic performance. The as-fabricated device exhibits a low reverse gate leakage of 2 nA/mm @ V-GD = -200 V, a stable forward gate current of 10 mu A/mm @ V-GS = 5 V, a positive threshold voltage of +1.7 V @ /(DS) = 10 mu A/mm with a high saturation current of 435 mA/mm, a high /(on)//(off) ratio of 5 x 10(10), and a low R-on,R-d/R-on,R-s ratio of 1.5. The as-developed technique with the LPCVD SiNx passivation and p-GaN gate regrowth may provide a way to enhance the performance of p-GaN E-HEMTs.
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