Reliability of scalable MoS2 FETs with 2 nm crystalline CaF2 insulators

标题
Reliability of scalable MoS2 FETs with 2 nm crystalline CaF2 insulators
作者
关键词
-
出版物
2D Materials
Volume 6, Issue 4, Pages 045004
出版商
IOP Publishing
发表日期
2019-06-12
DOI
10.1088/2053-1583/ab28f2

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