Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models
出版年份 2019 全文链接
标题
Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield Models
作者
关键词
-
出版物
Remote Sensing
Volume 11, Issue 15, Pages 1768
出版商
MDPI AG
发表日期
2019-07-29
DOI
10.3390/rs11151768
参考文献
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