High-precision determination of Silicon nanocrystals: Optical spectroscopy vs. electron microscopy

标题
High-precision determination of Silicon nanocrystals: Optical spectroscopy vs. electron microscopy
作者
关键词
-
出版物
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume -, Issue -, Pages -
出版商
IOP Publishing
发表日期
2019-07-25
DOI
10.1088/1361-6641/ab3536

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