Ga-doped ZnO thin film surface characterization by wavelet and fractal analysis

标题
Ga-doped ZnO thin film surface characterization by wavelet and fractal analysis
作者
关键词
GZO, Atomic force microscopy, Surface roughness, Wavelet, Fractal
出版物
APPLIED SURFACE SCIENCE
Volume 364, Issue -, Pages 843-849
出版商
Elsevier BV
发表日期
2016-01-05
DOI
10.1016/j.apsusc.2015.12.234

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