Coexistence of bipolar and unipolar resistive switching behaviors in the double-layer Ag/ZnS-Ag/CuAlO 2 /Pt memory device

标题
Coexistence of bipolar and unipolar resistive switching behaviors in the double-layer Ag/ZnS-Ag/CuAlO 2 /Pt memory device
作者
关键词
Resistive random access memory (RRAM), Bipolar and unipolar resistive switching (BRS and URS), Composition of conducting filaments
出版物
APPLIED SURFACE SCIENCE
Volume 360, Issue -, Pages 338-341
出版商
Elsevier BV
发表日期
2015-11-06
DOI
10.1016/j.apsusc.2015.11.022

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