Electrical evaluation of crack generation in SiN x and SiO x N y thin-film encapsulation layers for OLED displays

出版年份 2016 全文链接

标题

作者

关键词

OLED, Encapsulation, Leakage current density, Water vapor transmission rate, Crack density

出版物

Volume 370, Issue -, Pages 126-130

出版商

Elsevier BV

发表日期

2016-02-18

DOI

10.1016/j.apsusc.2016.02.142

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