XPS and EELS characterization of Mn2SiO4, MnSiO3 and MnAl2O4

标题

作者

关键词

X-ray photoelectron spectroscopy, Electron energy loss spectroscopy, Selective oxidation, Manganese silicates, Manganese aluminates

出版物

Volume 379, Issue -, Pages 242-248

出版商

Elsevier BV

发表日期

2016-04-13

DOI

10.1016/j.apsusc.2016.03.235

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